Surface characterization
- Cathode sputtering device - Emitech K550
- AFM Veeco
- AFM Park System NX20
- High Resolution X-ray Diffractometer
- FTIR spectrometer
- Schottky source electron microscope ThermoFisher Apreo2
- ThermoFisher Axia ChemiSem electron microscope
- ThermoFisher Phenom XL Gen2 tabletop electronic microscope
- Microscope Zeiss Orion NanoFab
- Contact angle measuring fixture KRUSS DSA 30 S
- Fogale optical profilometer
- KLA Tencor P-17 Profilometer
- Dektak profilometer
- Surface Plasmon Resonance (SPR)
- Microcalorimetry Station