Optical characterization
- High Resolution X-ray Diffractometer
- Ellipsometer Alpha-SE
- Ellipsometer Horiba
- Filmetrics
- Fourier Transform Infrared spectroscopy - FTIR
- HIPLM
- Epifluorescence microscopy
- Holographic microscope
- 3D confocal laser microscope
- Metallurgical optical microscope (Nikon)
- DMLM Optical microscope
- Zeiss Infinity optical microscope
- Laser femto set-up - Mai Tai and OPO
- Spectroscopy set-up iHR320
- Surface photoluminescence (PL-Mapper)
- Fogale optical profilometer
- Surface Plasmon Resonance (SPR)
- Raman spectroscope
- Solar simulator Station
- LED characterization Station
- Injection in waveguides Station
- EQE Station
- Flash Tester Station
- Phototransducer Station