Metrology and caracterization equipment
- 3D confocal laser microscope
- DMLM optical microscope
- Ellipsometer Alpha-SE
- Ellipsmeter Horiba
- Epifluorescence microscopy
- EQE station
- Filmetrics
- Flash tester station
- Fogale optical profilometer
- Fourier transform infrared spectroscopy - FTIR
- High resolution X-ray diffractometer
- HIPLM
- Holographic microscope
- Injection in waveguides station
- Laser femto set-up - Mai Tai and OPO
- LED characterization station
- Metallurgical optical microscope (Nikon)
- Phototransducer station
- QSPB reader
- Raman spectroscope
- Solar simulator station
- Spectroscopy set-up iHR320
- Surface photoluminiscence (Pl-Mapper)
- Surface Plasmon Resonance (SPR)
- Zeiss Infinity optical microscope
- Contactless conductivity probe
- DC Probe station
- Electrochemical Impedance System (EIS)
- Electrical measurements station in clean room
- Environmental chamber
- EQE station
- Flash Tester Station
- Hall effect station
- Impedance measuring device - Solartron
- LED characterization station
- MDP - Contactless electrical semiconductor characterization
- Solar simulator station