NORDSON QUADRA 5
![[Translate to English:] Rayon x](/3it/fileadmin/_processed_/d/1/csm_Quadra-5-transparent-twin_5104d68b68.png)
X-ray inspection system.
Quadra™ 5 is the X-ray inspection system of choice for submicron applications such as circuit board and semiconductor inspection, counterfeit component screening, and finished product quality control. The QuadraNT™ X-ray source and AspireFP™ detector are designed, manufactured and integrated in-house, specifically for electronics and manufacturing samples.
Specifications
| Parameter | Value | Note |
|---|---|---|
| Resolution | 3 MP | |
| Image refresh rate | 25 fps | |
| Pixel size | 50 um | |
| Display resolution | 94 PPI | |
| Inspection area | 20 " L * 17.5 " P (510 mm * 445 mm) | |
| Magnification | 2 500 x | Total magnification 45 000x |
| Source anode voltage (ray penetration) | 30-160kV |
Example of use
![[Translate to English:] Vue du système d'inspection rayon-X de traces de cuivres sur SI](/3it/fileadmin/_processed_/8/c/csm_traces_cuivre_si_dea5c5aa8b.jpg)
Copper trace on SI
![[Translate to English:] Vue rapprochée du système d'inspection rayon-X lors d'inspection de traces de cuivres sur SI](/3it/fileadmin/_processed_/d/5/csm_traces_cuivre_si_rapproche_9de934447b.jpg)
Copper trace on Si (closer view)
![[Translate to English:] Vue du système d'inspection rayon-X lors d'un inspection QFN](/3it/fileadmin/_processed_/6/6/csm_inspection_qfn_98875c7ffd.jpg)
QFN inspection
![[Translate to English:] Vue du système d'inspection rayon-X lors d'un inspection BGA](/3it/fileadmin/_processed_/c/5/csm_inspection_bga_01_5bdc8a45f6.jpg)