Electrical characterization

• C / V electrical measurement
• I / V electrical measurement
• Measure 4 points
• Hall effect measurement

Optical characterization

• Photoluminescence resolved in time

Cryogenic characterization

• Multi-functional High Magnetic Field (PPMS) Physical Properties Measurement System
• Shielded cryostat for null field with He4 or He3 for the characterization of Josephson and SQUID junctions
• Variable temperature cryostat (VTI)

Profilometry

• Contact profilometry
• Optical profilometry

Spectrometry

• Ellipsometry
• X-ray spectroscopy (EDX)
• Cathodoluminesence (CL)

Optical microscope

• Maximum magnification of 1000 X
• Equipped with a digital camera connected to a PC
• Diascopic and episcopic lighting
• Observation in bright field or dark field
• Polarizing filters (polarizer, analyzer)
• Nomarski filter

Scanning electron microscope 

• Possibility of observation under vacuum or variable pressure (up to 40 Pa)
• Acceleration voltage: from 100 V to 30 kV, adjustable in steps of 10V
• Probe size from 1nm to 20kV, 3nm to 1kV
• Beam current: 4 pA at 20 nA
• Magnification: from 20 X to 900 kX